Lessons Learned from Challenges in Developing a Test Setup to Replace a Faulty Universal Testing Machine. Indonesian Journal of Computing, Engineering, and Design (IJoCED), [S. l.], v. 7, n. 2, p. 74–89, 2025. DOI: 10.35806/ijoced.v7i2.496. Disponível em: https://ojs.sampoernauniversity.ac.id/index.php/IJOCED/article/view/496. Acesso em: 23 oct. 2025.